Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing Förderungs- und Betriebs GmbH - Beschäftigte12

Name: Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing Förderungs- und Betriebs GmbH - Beschäftigte12
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- Beschäftigte12

1Die Defizite und ihre Ursachen/Gründe44

die auf finanzielle Größen aufbauen

auf der es am besten möglich ist (vgl

Defect Reduction Study of MBE Grown CdTe Thin Films by Annealing Förderungs- und Betriebs GmbH - Beschäftigte12MBE grown CdTe thin films were annealed in this study to decrease the number density of defects. For annealing, a system was designed and constructed. During anneals; anneal temperature, anneal time, anneal cycle and hydrogen gas effects were analyzed. The effects of annealing parameters were analyzed by SEM, AFM, Everson Etch method, resonance Raman spectroscopy, and Photoluminescence measurement. In our studies, dislocation density and Te

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